Josef Hug, Hans : rechercher sur Z-Library

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1

Atomic contact potential variations of Si(111)-7 × 7 analyzed by Kelvin probe force microscopy

Kawai, Shigeki, Glatzel, Thilo, Hug, Hans-Josef, Meyer, Ernst

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 2.24 MB

english, 2010

2

10.1038/ng759

Rovio, Anja T., Marchington, David R., Donat, Susanne, Schuppe, Hans-Christian, Abel, Josef, Fritsche, Ellen, Elliott, David J., Laippala, Pekka, Ahola, Arja L., McNay, David, Harrison, Robert F., Hug

Journal:

Nature Genetics

Année:

2001

Langue:

english

Fichier:

PDF, 80 KB

english, 2001

3

Complex phase compositions in nanostructured coatings as evidenced by photoelectron spectroscopy: The case of AlâSiâN hard coatings

PeÌlisson-Schecker, Aude, Hug, Hans Josef, Patscheider, JoÌrg

Journal:

Journal of Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 633 KB

english, 2010

4

Morphology, microstructure evolution and optical properties of Al–Si–N nanocomposite coatings

Pélisson-Schecker, Aude, Hug, Hans Josef, Patscheider, Jörg

Journal:

Surface and Coatings Technology

Année:

2014

Langue:

english

Fichier:

PDF, 873 KB

english, 2014

5

AlN/Si3N4 multilayers as an interface model system for Al1−xSixN/Si3N4 nanocomposite thin films

Parlinska-Wojtan, Magdalena, Pélisson-Schecker, Aude, Hug, Hans Josef, Rutkowski, Bogdan, Patscheider, Jörg

Journal:

Surface and Coatings Technology

Année:

2015

Langue:

english

Fichier:

PDF, 1.78 MB

english, 2015

6

[Advanced Texts in Physics] Scanning Probe Microscopy || Introduction to Scanning Tunneling Microscopy

Meyer, Ernst, Hug, Hans Josef, Bennewitz, Roland

Année:

2004

Langue:

english

Fichier:

PDF, 7.91 MB

english, 2004

7

[Advanced Texts in Physics] Scanning Probe Microscopy ||

Meyer, Ernst, Hug, Hans Josef, Bennewitz, Roland

Année:

2004

Langue:

english

Fichier:

PDF, 37.28 MB

english, 2004

8

[IEEE 2006 IEEE International Symposium on the Applications of Ferroelectrics - Sunset Beach, NC, USA (2006.07.30-2006.08.3)] 2006 IEEE International Symposium on the Applications of Ferroelectrics - PZT Films on Wafers and Fibers for MEMS Application

Thapliyal, Ratnesh, Pellision, Aude, Logvinovich, Dmitry, Amberg, Martin, Hug, Hans Josef, Fortunato, Giuseppino

Année:

2006

Langue:

english

Fichier:

PDF, 1.51 MB

english, 2006

9

In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

Niehuis, Ewald, Moellers, Rudolf, Kollmer, Felix, Arlinghaus, Henrik, Bernard, Laetita, Josef Hug, Hans, Vranjkovic, Sasa, Dianoux, Raphaelle, Scheidemann, Adi

Journal:

Microscopy and Microanalysis

Année:

2014

Langue:

english

Fichier:

PDF, 704 KB

english, 2014

10

[IEEE 2006 IEEE International Symposium on the Applications of Ferroelectrics - Sunset Beach, NC, USA (2006.07.30-2006.08.3)] 2006 IEEE International Symposium on the Applications of Ferroelectrics - PZT Films on Wafers and Fibers for MEMS Application

Thapliyal, Ratnesh, Pellision, Aude, Logvinovich, Dmitry, Amberg, Martin, Hug, Hans Josef, Fortunato, Giuseppino

Année:

2006

Langue:

english

Fichier:

PDF, 1.51 MB

english, 2006

11

Halbach Effect at the Nanoscale from Chiral Spin Textures

Marioni, Miguel A, Penedo, Marcos, Baćani, Mirko, Schwenk, Johannes, Hug, Hans Josef

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 848 KB

english, 2018

12

SFM Assisted In-Situ by ToF-SIMS: Accessing Chemical Information in True Three Dimensions

Dianoux, Raphaelle, Scheidemann, Adi, Niehuis, Ewald, Mollers, Rudolf, Kollmer, Felix, Arlinghaus, Henrik, Hug, Hans-Josef, Bernard, Laetitia, Vranjkovic, Sasa

Journal:

Microscopy and Microanalysis

Année:

2015

Langue:

english

Fichier:

PDF, 82 KB

english, 2015

13

Direct Measurement of Ion Redistribution and Resulting Modification of Chemical Equilibria in Polymer Thin Film Light-emitting Electrochemical Cells

Kawecki, Maciej, Hany, Roland, Diethelm, Matthias, Jenatsch, Sandra, Grossmann, Quirin, Bernard, Laetitia, Hug, Hans Josef

Journal:

ACS Applied Materials & Interfaces

Année:

2018

Langue:

english

Fichier:

PDF, 11.88 MB

english, 2018

14

Understanding the microstructural evolution and mechanical properties of transparent Al-O-N and Al-Si-O-N films

Fischer, Maria, Trant, Mathis, Thorwarth, Kerstin, Crockett, Rowena, Patscheider, Jörg, Hug, Hans Josef

Journal:

Science and Technology of Advanced Materials

Année:

2019

Fichier:

PDF, 1.79 MB

2019

15

Hysteresis-free magnetization reversal of exchange-coupled bilayers with finite magnetic anisotropy

Vogler, Christoph, Heigl, Michael, Mandru, Andrada-Oana, Hebler, Birgit, Marioni, Miguel, Hug, Hans Josef, Albrecht, Manfred, Suess, Dieter

Journal:

Physical Review B

Année:

2020

Fichier:

PDF, 751 KB

2020

16

Microscopic Origin of Magnetization Reversal in Nanoscale Exchange-Coupled Ferri-/Ferromagnetic Bilayers: Implications for High Energy Density Permanent Magnets and Spintronic Devices

Heigl, Michael, Vogler, Christoph, Mandru, Andrada-Oana, Zhao, Xue, Hug, Hans Josef, Suess, Dieter, Albrecht, Manfred

Journal:

ACS Applied Nano Materials

Année:

2020

Fichier:

PDF, 1.82 MB

2020

17

Coexistence of distinct skyrmion phases observed in hybrid ferromagnetic/ferrimagnetic multilayers

Mandru, Andrada-Oana, YÄ±ldÄ±rÄ±m, OÄuz, Tomasello, Riccardo, Heistracher, Paul, Penedo, Marcos, Giordano, Anna, Suess, Dieter, Finocchio, Giovanni, Hug, Hans Josef

Journal:

Nature Communications

Année:

2020

Fichier:

PDF, 3.77 MB

2020